SPARQ is the ideal instrument for characterizing multi-port devices.
The SPARQ signal integrity network analyzers connect directly to the device-under-test and to PC-based software through a single USB connection for quick, multi-port S-parameter measurements.
Features:
- Provides S-parameter measurements up to four-ports
- Measures from DC to 40 GHz
- One-button-press internal OSLT calibration
- Analyzes in both frequency- and time-domain
- Produces mixed-mode and single-ended simulation-ready S-parameters
- Includes advanced de-embedding features
- Inherent TDR / TDT capability and preview modes for quick checks and debugging
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